Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques

  1. Chielle, E.
  2. Rosa, F.
  3. Rodrigues, G.S.
  4. Tambara, L.A.
  5. Tonfat, J.
  6. Macchione, E.
  7. Aguirre, F.
  8. Added, N.
  9. Medina, N.
  10. Aguiar, V.
  11. Silveira, M.A.G.
  12. Ost, L.
  13. Reis, R.
  14. Cuenca-Asensi, S.
  15. Kastensmidt, F.L.
Revue:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Année de publication: 2016

Volumen: 63

Número: 4

Pages: 2208-2216

Type: Article

DOI: 10.1109/TNS.2016.2525735 GOOGLE SCHOLAR

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