Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques

  1. Chielle, E.
  2. Rosa, F.
  3. Rodrigues, G.S.
  4. Tambara, L.A.
  5. Tonfat, J.
  6. Macchione, E.
  7. Aguirre, F.
  8. Added, N.
  9. Medina, N.
  10. Aguiar, V.
  11. Silveira, M.A.G.
  12. Ost, L.
  13. Reis, R.
  14. Cuenca-Asensi, S.
  15. Kastensmidt, F.L.
Journal:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Year of publication: 2016

Volume: 63

Issue: 4

Pages: 2208-2216

Type: Article

DOI: 10.1109/TNS.2016.2525735 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus