Multiple film plane diagnostic for shocked lattice measurements (invited)

  1. Kalantar, D.H.
  2. Bringa, E.
  3. Caturla, M.
  4. Colvin, J.
  5. Lorenz, K.T.
  6. Kumar, M.
  7. Stölken, J.
  8. Allen, A.M.
  9. Rosolankova, K.
  10. Wark, J.S.
  11. Meyers, M.A.
  12. Schneider, M.
  13. Boehly, T.R.
Revue:
Review of Scientific Instruments

ISSN: 0034-6748

Année de publication: 2003

Volumen: 74

Número: 3 II

Pages: 1929-1934

Type: Communication dans un congrès

DOI: 10.1063/1.1538325 GOOGLE SCHOLAR
La source de données: Scopus