Multiple film plane diagnostic for shocked lattice measurements (invited)

  1. Kalantar, D.H.
  2. Bringa, E.
  3. Caturla, M.
  4. Colvin, J.
  5. Lorenz, K.T.
  6. Kumar, M.
  7. Stölken, J.
  8. Allen, A.M.
  9. Rosolankova, K.
  10. Wark, J.S.
  11. Meyers, M.A.
  12. Schneider, M.
  13. Boehly, T.R.
Journal:
Review of Scientific Instruments

ISSN: 0034-6748

Year of publication: 2003

Volume: 74

Issue: 3 II

Pages: 1929-1934

Type: Conference paper

DOI: 10.1063/1.1538325 GOOGLE SCHOLAR
Data source: Scopus