
SERGIO ANTONIO
CUENCA ASENSI
CATEDRATICO/A DE UNIVERSIDAD
Publications (119) SERGIO ANTONIO CUENCA ASENSI publications
2024
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Evaluation of Fault Mitigation Techniques Based on Approximate Computing Under Radiation
IEEE Transactions on Nuclear Science, Vol. 71, Núm. 8, pp. 1715-1721
2023
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A Lightweight Mitigation Technique for Resource- Constrained Devices Executing DNN Inference Models Under Neutron Radiation
IEEE Transactions on Nuclear Science, Vol. 70, Núm. 8, pp. 1625-1633
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Analysis of Kernel Redundancy for Soft Error Mitigation on Embedded GPUs
IEEE Transactions on Nuclear Science, Vol. 70, Núm. 8, pp. 1700-1707
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Assessment of Radiation-Induced Soft Errors on Lightweight Cryptography Algorithms Running on a Resource-Constrained Device
IEEE Transactions on Nuclear Science, Vol. 70, Núm. 8, pp. 1805-1813
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Bare-Metal Redundant Multi-Threading on Multicore SoCs Under Neutron Irradiation
IEEE Transactions on Nuclear Science, Vol. 70, Núm. 8, pp. 1643-1651
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Evaluation of fault injection tools for reliability estimation of microprocessor-based embedded systems
Microprocessors and Microsystems, Vol. 96
2022
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Hybrid Lockstep Technique for Soft Error Mitigation
IEEE Transactions on Nuclear Science, Vol. 69, Núm. 7, pp. 1574-1581
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Redundant Portable Multi-Threading for Soft Error Mitigation on Multicore Systems on Chip
RADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems
2021
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Guest Editors' Words
Journal of Integrated Circuits and Systems
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Special Issue on Hardware and Software Fault Tolerance Message of Guest Editors
Journal of Integrated Circuits and Systems
2020
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An Experimental Comparison of Fault Injection Tools for Microprocessor-based Systems
21st IEEE Latin-American Test Symposium, LATS 2020
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Empirical Mathematical Model of Microprocessor Sensitivity and Early Prediction to Proton and Neutron Radiation-Induced Soft Errors
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1511-1520
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Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems
Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 36, Núm. 1, pp. 47-57
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Soft error reliability predictor based on a Deep Feedforward Neural Network
21st IEEE Latin-American Test Symposium, LATS 2020
2019
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A compact model to evaluate the effects of high level c++ code hardening in radiation environments
Electronics (Switzerland), Vol. 8, Núm. 6
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Building ATMR circuits using approximate library and heuristic approaches
Microelectronics Reliability, Vol. 97, pp. 24-30
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Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection
Microelectronics Reliability, Vol. 100-101
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Metaheuristic optimisation algorithms for tuning a bioinspired retinal model
Sensors (Switzerland), Vol. 19, Núm. 22
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Nonintrusive Automatic Compiler-Guided Reliability Improvement of Embedded Applications under Proton Irradiation
IEEE Transactions on Nuclear Science, Vol. 66, Núm. 7, pp. 1500-1509
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Nuevos enfoques heurísticos para resolver problemas combinatorios
Anales de la Academia de Ciencias de Cuba, Vol. 9, Núm. 3, pp. 58-60