Building ATMR circuits using approximate library and heuristic approaches

  1. Albandes, I.
  2. Martins, M.
  3. Cuenca-Asensi, S.
  4. Kastensmidt, F.L.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2019

Volume: 97

Pages: 24-30

Type: Article

DOI: 10.1016/J.MICROREL.2019.04.002 GOOGLE SCHOLAR
Data source: Scopus