Combined master and Fokker-Planck equations for the modeling of the kinetics of extended defects in Si

  1. Lampin, E.
  2. Ortiz, C.J.
  3. Cowern, N.E.B.
  4. Colombeau, B.
  5. Cristiano, F.
Aldizkaria:
Solid-State Electronics

ISSN: 0038-1101

Argitalpen urtea: 2005

Alea: 49

Zenbakia: 7

Orrialdeak: 1168-1171

Mota: Artikulua

DOI: 10.1016/J.SSE.2005.04.006 GOOGLE SCHOLAR