Combined master and Fokker-Planck equations for the modeling of the kinetics of extended defects in Si

  1. Lampin, E.
  2. Ortiz, C.J.
  3. Cowern, N.E.B.
  4. Colombeau, B.
  5. Cristiano, F.
Journal:
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 2005

Volume: 49

Issue: 7

Pages: 1168-1171

Type: Article

DOI: 10.1016/J.SSE.2005.04.006 GOOGLE SCHOLAR
Data source: Scopus