Feature selection, mutual information, and the classification of high-dimensional patterns: Applications to image classification and microarray data analysis

  1. Bonev, B.
  2. Escolano, F.
  3. Cazorla, M.
Revista:
Pattern Analysis and Applications

ISSN: 1433-7541

Ano de publicación: 2008

Volume: 11

Número: 3-4

Páxinas: 309-319

Tipo: Artigo

DOI: 10.1007/S10044-008-0107-0 GOOGLE SCHOLAR
Fonte de datos: Scopus