Feature selection, mutual information, and the classification of high-dimensional patterns: Applications to image classification and microarray data analysis

  1. Bonev, B.
  2. Escolano, F.
  3. Cazorla, M.
Aldizkaria:
Pattern Analysis and Applications

ISSN: 1433-7541

Argitalpen urtea: 2008

Alea: 11

Zenbakia: 3-4

Orrialdeak: 309-319

Mota: Artikulua

DOI: 10.1007/S10044-008-0107-0 GOOGLE SCHOLAR
Datuen iturria: Scopus