Feature selection, mutual information, and the classification of high-dimensional patterns: Applications to image classification and microarray data analysis

  1. Bonev, B.
  2. Escolano, F.
  3. Cazorla, M.
Zeitschrift:
Pattern Analysis and Applications

ISSN: 1433-7541

Datum der Publikation: 2008

Ausgabe: 11

Nummer: 3-4

Seiten: 309-319

Art: Artikel

DOI: 10.1007/S10044-008-0107-0 GOOGLE SCHOLAR
Datenquelle: Scopus