Feature selection, mutual information, and the classification of high-dimensional patterns: Applications to image classification and microarray data analysis

  1. Bonev, B.
  2. Escolano, F.
  3. Cazorla, M.
Revue:
Pattern Analysis and Applications

ISSN: 1433-7541

Année de publication: 2008

Volumen: 11

Número: 3-4

Pages: 309-319

Type: Article

DOI: 10.1007/S10044-008-0107-0 GOOGLE SCHOLAR
La source de données: Scopus