Low-Frequency Noise Behavior of La-Doped HfSiON/Metal Gate nMOSFETs
- Choi, Do-Young
- Park, Min Sang
- Sohn, Chang Woo
- Sagong, Hyun Chul
- Jung, Eui-Young
- Lee, Jeong-Soo
- Jeong, Yoon-Ha
- Kang, Chang Yong
Libro:
2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
ISBN: 978-1-4244-9111-7
Ano de publicación: 2011
Congreso: 49th Annual IEEE International Reliability Physics Symposium (IRPS)
Tipo: Achega congreso