Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime

  1. Tewari, S.
  2. Sabater, C.
  3. Kumar, M.
  4. Stahl, S.
  5. Crama, B.
  6. Van Ruitenbeek, J.M.
Aldizkaria:
Review of Scientific Instruments

ISSN: 1089-7623,  0034-6748

Argitalpen urtea: 2017

Alea: 88

Zenbakia: 9

Mota: Artikulua

DOI: 10.1063/1.5003391 GOOGLE SCHOLAR
Datuen iturria: Scopus