Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime
- Tewari, S.
- Sabater, C.
- Kumar, M.
- Stahl, S.
- Crama, B.
- Van Ruitenbeek, J.M.
ISSN: 1089-7623, 0034-6748
Year of publication: 2017
Volume: 88
Issue: 9
Type: Article