Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime

  1. Tewari, S.
  2. Sabater, C.
  3. Kumar, M.
  4. Stahl, S.
  5. Crama, B.
  6. Van Ruitenbeek, J.M.
Revista:
Review of Scientific Instruments

ISSN: 1089-7623,  0034-6748

Any de publicació: 2017

Volum: 88

Número: 9

Tipus: Article

DOI: 10.1063/1.5003391 GOOGLE SCHOLAR
Font de les dades: Scopus