Relative stability of silicon self-interstitial defects
- Subramanian, G.
- Jones, K.S.
- Law, M.E.
- Caturla, M.J.
- Theiss, S.
- De La Rubia, T.D.
ISSN: 0272-9172
Année de publication: 2000
Volumen: 610
Pages: B11.10.1-B11.10.6
Type: Article
ISSN: 0272-9172
Année de publication: 2000
Volumen: 610
Pages: B11.10.1-B11.10.6
Type: Article