Relative stability of silicon self-interstitial defects

  1. Subramanian, G.
  2. Jones, K.S.
  3. Law, M.E.
  4. Caturla, M.J.
  5. Theiss, S.
  6. De La Rubia, T.D.
Journal:
Materials Research Society Symposium - Proceedings

ISSN: 0272-9172

Year of publication: 2000

Volume: 610

Pages: B11.10.1-B11.10.6

Type: Article

DOI: 10.1557/PROC-610-B11.10 GOOGLE SCHOLAR
Data source: Scopus