Effect of the silicon chemical form on the emission intensity in inductively coupled plasma atomic emission spectrometry for xylene matrices

  1. Sánchez, R.
  2. Todolí, J.-L.
  3. Lienemann, C.-P.
  4. Mermet, J.-M.
Aldizkaria:
Journal of Analytical Atomic Spectrometry

ISSN: 0267-9477,  1364-5544

Argitalpen urtea: 2009

Alea: 24

Zenbakia: 4

Orrialdeak: 391-401

Mota: Artikulua

DOI: 10.1039/B806594M GOOGLE SCHOLAR
Datuen iturria: Scopus