Effect of the silicon chemical form on the emission intensity in inductively coupled plasma atomic emission spectrometry for xylene matrices

  1. Sánchez, R.
  2. Todolí, J.-L.
  3. Lienemann, C.-P.
  4. Mermet, J.-M.
Journal:
Journal of Analytical Atomic Spectrometry

ISSN: 0267-9477,  1364-5544

Year of publication: 2009

Volume: 24

Issue: 4

Pages: 391-401

Type: Article

DOI: 10.1039/B806594M GOOGLE SCHOLAR
Data source: Scopus