Publicaciones (27) Publicaciones de ALEJANDRO SERRANO CASES

2024

  1. Evaluation of Fault Mitigation Techniques Based on Approximate Computing Under Radiation

    IEEE Transactions on Nuclear Science, Vol. 71, Núm. 8, pp. 1715-1721

2023

  1. A Software-Only Approach to Enable Diverse Redundancy on Intel GPUs for Safety-Related Kernels

    Proceedings of the ACM Symposium on Applied Computing

  2. Analysis of Kernel Redundancy for Soft Error Mitigation on Embedded GPUs

    IEEE Transactions on Nuclear Science, Vol. 70, Núm. 8, pp. 1700-1707

  3. Bare-Metal Redundant Multi-Threading on Multicore SoCs Under Neutron Irradiation

    IEEE Transactions on Nuclear Science, Vol. 70, Núm. 8, pp. 1643-1651

  4. Evaluation of fault injection tools for reliability estimation of microprocessor-based embedded systems

    Microprocessors and Microsystems, Vol. 96

  5. Quasi Isolation QoS Setups to Control MPSoC Contention in Integrated Software Architectures

    Leibniz International Proceedings in Informatics, LIPIcs

2022

  1. Hybrid Lockstep Technique for Soft Error Mitigation

    IEEE Transactions on Nuclear Science, Vol. 69, Núm. 7, pp. 1574-1581

  2. Redundant Portable Multi-Threading for Soft Error Mitigation on Multicore Systems on Chip

    RADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems

2021

  1. Leveraging hardware QoS to control contention in the Xilinx Zynq UltraScale+ MPSoC

    Leibniz International Proceedings in Informatics, LIPIcs

2020

  1. An Experimental Comparison of Fault Injection Tools for Microprocessor-based Systems

    21st IEEE Latin-American Test Symposium, LATS 2020

  2. Empirical Mathematical Model of Microprocessor Sensitivity and Early Prediction to Proton and Neutron Radiation-Induced Soft Errors

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1511-1520

  3. Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

    Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 36, Núm. 1, pp. 47-57

  4. Soft error reliability predictor based on a Deep Feedforward Neural Network

    21st IEEE Latin-American Test Symposium, LATS 2020

2019

  1. A compact model to evaluate the effects of high level c++ code hardening in radiation environments

    Electronics (Switzerland), Vol. 8, Núm. 6

  2. Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection

    Microelectronics Reliability, Vol. 100-101

  3. Nonintrusive Automatic Compiler-Guided Reliability Improvement of Embedded Applications under Proton Irradiation

    IEEE Transactions on Nuclear Science, Vol. 66, Núm. 7, pp. 1500-1509

  4. Softerror mitigation for multi-core processors based on thread replication

    LATS 2019 - 20th IEEE Latin American Test Symposium

  5. Softerror mitigation for multi-core processors based on thread replication

    2019 20TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS)

2018

  1. Design of approximate-TMR using approximate library and heuristic approaches

    Microelectronics Reliability, Vol. 88-90, pp. 898-902

  2. Improving approximate-TMR using multi-objective optimization genetic algorithm

    2018 IEEE 19th Latin-American Test Symposium, LATS 2018