University of Florida-ko ikertzaileekin lankidetzan egindako argitalpenak (4)

2000

  1. Relative stability of silicon self-interstitial defects

    Materials Research Society Symposium - Proceedings, Vol. 610, pp. B11.10.1-B11.10.6

  2. Relative stability of silicon self-interstitial defects

    Materials Research Society Symposium - Proceedings

1998

  1. Predictive simulation of transient activation processes in boron-doped silicon structures

    Technical Digest - International Electron Devices Meeting

  2. Predictive simulation of transient activation processes in boron-doped silicon structures

    INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST