Face Recognition Bias Assessment through Quality Estimation Models

  1. Lopez Paya, L.
  2. Cordoba, P.
  3. Sanchez Perez, A.
  4. Barrachina, J.
  5. Benavent-Lledo, M.
  6. Mulero-Pérez, D.
  7. Garcia-Rodriguez, J.
Aldizkaria:
Electronics (Switzerland)

ISSN: 2079-9292

Argitalpen urtea: 2023

Alea: 12

Zenbakia: 22

Mota: Artikulua

DOI: 10.3390/ELECTRONICS12224649 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus