Defect and dopant diffusion in ion implanted silicon: An atomic scale simulation approach
- Caturla, MJ
- Theiss, SK
- Lenosky, TJ
- de la Rubia, TD
ISBN: 0-7803-4774-9
Année de publication: 1998
Pages: 489-492
Congreso: International Electron Devices Meeting (IEDM)
Type: Communication dans un congrès