Efficient Metric for Register File Criticality in Processor-Based Systems

  1. Restrepo-Calle, F.
  2. Cuenca-Asensi, S.
  3. Martinez-Alvarez, A.
  4. Chielle, E.
  5. Kastensmidt, F.
Colección de libros:
2014 15TH LATIN AMERICAN TEST WORKSHOP - LATW

ISSN: 2373-0862

ISBN: 978-1-4799-4711-9

Ano de publicación: 2014

Congreso: 15th Latin American Test Workshop (LATW)

Tipo: Achega congreso