Efficient Metric for Register File Criticality in Processor-Based Systems

  1. Restrepo-Calle, F.
  2. Cuenca-Asensi, S.
  3. Martinez-Alvarez, A.
  4. Chielle, E.
  5. Kastensmidt, F.
Book Series:
2014 15TH LATIN AMERICAN TEST WORKSHOP - LATW

ISSN: 2373-0862

ISBN: 978-1-4799-4711-9

Year of publication: 2014

Congress: 15th Latin American Test Workshop (LATW)

Type: Conference paper

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Data source: WoS