Current saturation through image surface states in scanning tunneling microscopy

  1. Louis, E.
  2. Flores, F.
  3. Echenique, P.M.
Revue:
Solid State Communications

ISSN: 0038-1098

Année de publication: 1986

Volumen: 59

Número: 7

Pages: 453-455

Type: Article

DOI: 10.1016/0038-1098(86)90686-1 GOOGLE SCHOLAR