Minimization of the effect of silicon chemical form in xylene matrices on ICP-AES performance

  1. Sánchez, R.
  2. Todolí, J.L.
  3. Lienemann, C.-P.
  4. Mermet, J.-M.
Journal:
Journal of Analytical Atomic Spectrometry

ISSN: 0267-9477 1364-5544

Year of publication: 2009

Volume: 24

Issue: 10

Pages: 1382-1388

Type: Article

DOI: 10.1039/B906568G GOOGLE SCHOLAR