Publicaciones (13) Publicaciones de MARIA BARALIDA TOMAS LOPEZ

2024

  1. Calibration of a photographic slider for subpixel tracking tests on heavy objects

    Proceedings of SPIE - The International Society for Optical Engineering

  2. How to measure a subpixel displacement

    Proceedings of SPIE - The International Society for Optical Engineering

  3. Thermic distortions in target tracking with subpixel accuracy

    Proceedings of SPIE - The International Society for Optical Engineering

2023

  1. Analyzing implicit gender bias in Optics and Photonics at the predoctoral stage in Spain

    Óptica pura y aplicada, Vol. 56, Núm. 3

  2. Comparative Analysis of Discrete Subtraction and Cross-Correlation for Subpixel Object Tracking

    Applied Sciences (Switzerland), Vol. 13, Núm. 14

  3. Determination of Maximum Accuracy of Concrete Textures as Natural Targets for Movement Tracking Through DIC

    Journal of Nondestructive Evaluation, Vol. 42, Núm. 3

  4. Innovative Approaches for Organizing an Inclusive Optics and Photonics Conference in Virtual Format

    Optics, Vol. 4, Núm. 1, pp. 156-170

2022

  1. Gender analysis on the Ph.D. theses defended in Spain in the field of Optics and Photonics

    IEEE Global Engineering Education Conference, EDUCON

  2. Medida de movimiento estructural como ABP con transferencia desde la investigación

    Memorias del Programa de Redes de investigación en docencia universitaria: Convocatoria 2021-22 (Instituto de Ciencias de la Educación), pp. 1505-1522

2021

  1. Use of image correlation to measure macroscopic strains by hygric swelling in sandstone rocks

    Applied Sciences (Switzerland), Vol. 11, Núm. 6

2020

  1. Influence of neighborhood size and cross-correlation peak-fitting method on location accuracy

    Sensors (Switzerland), Vol. 20, Núm. 22, pp. 1-17

  2. Peak-locking minimization by three adjustment methods

    Proceedings of SPIE - The International Society for Optical Engineering

  3. Use of image correlation to measure hygric swelling in rocks

    Proceedings of SPIE - The International Society for Optical Engineering