Atomistic simulations of threshold displacement energies in SiO2
- Mota, F
- Caturla, MJ
- Perlado, JM
- Dominguez, E
- Kubota, A
- Wang, LM (coord.)
- Fromknecht, R (coord.)
- Snead, LL (coord.)
- Downey, DF (coord.)
- Takahashi, H (coord.)
ISSN: 0272-9172
ISBN: 1-55899-730-X
Datum der Publikation: 2004
Ausgabe: 792
Seiten: 485-490
Kongress: Symposium on Radiation Effects and Ion-Beam Processing of Materials held at the 2003 MRS Fall Meeting
Art: Konferenz-Beitrag