Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities
- Isaza-Gonzalez, Jose
- Serrano-Cases, Alejandro
- Restrepo-Calle, Felipe
- Cuenca-Asensi, Sergio
- Martinez-Alvarez, Antonio
ISBN: 978-1-5090-1331-9
Datum der Publikation: 2016
Seiten: 27-32
Kongress: 17th IEEE Latin-American Test Symposium (LATS)
Art: Konferenz-Beitrag