Relative stability of silicon self-interstitial defects
- Subramanian, G.
- Jones, K.S.
- Law, M.E.
- Caturla, M.J.
- Theiss, S.
- De La Rubia, T.D.
Proceedings:
Materials Research Society Symposium - Proceedings
ISSN: 0272-9172
Year of publication: 2000
Volume: 610
Type: Conference paper