Determination of electron diffusion lengths in nanostructured oxide electrodes from photopotential maps obtained with the scanning microscope for semiconductor characterization
- Lana-Villarreal, T.
- Monllor-Satoca, D.
- Gómez, R.
- Salvador, P.
ISSN: 1388-2481
Datum der Publikation: 2006
Ausgabe: 8
Nummer: 11
Seiten: 1784-1790
Art: Artikel