A machine learning and integration based architecture for cognitive disorder detection used for early autism screening

  1. Peral, J.
  2. Gil, D.
  3. Rotbei, S.
  4. Amador, S.
  5. Guerrero, M.
  6. Moradi, H.
Aldizkaria:
Electronics (Switzerland)

ISSN: 2079-9292

Argitalpen urtea: 2020

Alea: 9

Zenbakia: 3

Mota: Artikulua

DOI: 10.3390/ELECTRONICS9030516 GOOGLE SCHOLAR lock_openSarbide irekia editor