Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances

  1. Beléndez, A.
  2. Beléndez, T.
  3. Neipp, C.
  4. Pascual, I.
Revue:
Applied Optics

ISSN: 2155-3165,  1559-128X

Année de publication: 2002

Volumen: 41

Número: 32

Pages: 6802-6808

Type: Article

DOI: 10.1364/AO.41.006802 GOOGLE SCHOLAR
La source de données: Scopus