Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors

  1. Restrepo-Calle, F.
  2. Cuenca-Asensi, S.
  3. Martínez-Álvarez, A.
  4. Chielle, E.
  5. Kastensmidt, F.L.
Revue:
Journal of Electronic Testing: Theory and Applications (JETTA)

ISSN: 1573-0727,  0923-8174

Année de publication: 2015

Volumen: 31

Número: 2

Pages: 139-150

Type: Article

DOI: 10.1007/S10836-015-5513-9 GOOGLE SCHOLAR
La source de données: Scopus