Reliability on ARM processors against soft errors by a purely software approach

  1. Chielle, E.
  2. Rosa, F.
  3. Rodrigues, G.S.
  4. Tambara, L.A.
  5. Kastensmidt, F.L.
  6. Reis, R.
  7. Cuenca-Asensi, S.
Proceedings:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

ISBN: 9781509002313

Year of publication: 2015

Volume: 2015-December

Type: Conference paper

DOI: 10.1109/RADECS.2015.7365660 GOOGLE SCHOLAR
Data source: Scopus