Dependability evaluation of COTS microprocessors via on-chip debugging facilities
- Isaza-Gonzalez, J.
- Serrano-Cases, A.
- Restrepo-Calle, F.
- Cuenca-Asensi, S.
- Martinez-Alvarez, A.
Proceedings:
LATS 2016 - 17th IEEE Latin-American Test Symposium
ISBN: 9781509013319
Year of publication: 2016
Pages: 27-32
Type: Conference paper