Contrast of a HDL model and COTS version of a microprocessor for soft-error testing
- Isaza-González, J.
- Serrano-Cases, A.
- Martinez-Álvarez, A.
- Cuenca-Asensi, S.
- Guzmán-Miranda, H.
- Aguirre, M.A.
Proceedings:
LATS 2017 - 18th IEEE Latin-American Test Symposium
ISBN: 9781538604151
Year of publication: 2017
Type: Conference paper