Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

  1. Serrano-Cases, A.
  2. Restrepo-Calle, F.
  3. Cuenca-Asensi, S.
  4. Martínez-Álvarez, A.
Revue:
Journal of Electronic Testing: Theory and Applications (JETTA)

ISSN: 1573-0727,  0923-8174

Année de publication: 2020

Volumen: 36

Número: 1

Pages: 47-57

Type: Article

DOI: 10.1007/S10836-019-05846-4 GOOGLE SCHOLAR
La source de données: Scopus