Empirical Mathematical Model of Microprocessor Sensitivity and Early Prediction to Proton and Neutron Radiation-Induced Soft Errors
- Serrano-Cases, A.
- Reyneri, L.M.
- Morilla, Y.
- Cuenca-Asensi, S.
- Martinez-Alvarez, A.
ISSN: 1558-1578, 0018-9499
Année de publication: 2020
Volumen: 67
Número: 7
Pages: 1511-1520
Type: Article