Study of atomic-size structures using a scanning tunneling microscope with force resonant-detection

Resumen

Nanoscience is an interdisciplinary science that could be defined as the search and study of new properties (physical, chemical, etc..) that emerge as the size of materials is reduced down to nanometric scale (or nanoscale). A valuable tool for achieving this aim is the Scanning Tunneling Microscope (STM). Since its invention by Binnig and Rohrer, the STM has become an essential tool for the characterization and manipulation at the nano-scale. Many other microscopes have been developed rooted in the STM, thus giving birth to the family of Scanning Probe Microscopes (SPM). One of the achievements of this work has been the design and calibration of a SPM which allows a simultaneous measurement of electron transport and mechanical properties (adhesion force and energy dissipation) of nanostructures, in varying conditions of temperature from 1.5K to room temperature. This microscope has a conducting tip fixed at one of the arms of a microfabricated quartz tuning fork used in the resonant detection of forces. This detection system was also implemented and tested on a commercial microscope operating in ultra high vacuum and low temperatures conditions. With the microscope above, electrical and mechanical properties of different nanostructures, including: atomic size contacts, surface molecules, nano-capacitors and graphite, have been studied. It is also worth mentioning the experimental development of a new technique of local graphene electro-exfoliation of graphite and its explanation by means of a theoretical model.