Contrast of a HDL model and COTS version of a microprocessor for Soft-Error Testing
- Isaza-Gonzalez, Jose
- Serrano-Cases, Alejandro
- Martinez-Alvarez, Antonio
- Cuenca-Asensi, Sergio
- Guzman-Miranda, H.
- Aguirre, Miguel A.
Book:
2017 18TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS 2017)
ISBN: 978-1-5386-0415-1
Year of publication: 2017
Congress: 18th IEEE Latin American Test Symposium (LATS)
Type: Conference paper